HIGH-RESOLUTION SCANNING TRANSMISSION ELECTRON MICROSCOPE (TEM/STEM) JEOL ARM200F
State-of-the-art transmission electron microscope (TEM) and scanning TEM (STEM) with spherical aberration corrector of the STEM probe (CEOS), with a combined energy filter and an electron energy loss analyzer (Gatan). This microscope has a newly developed cold field emission source (CFEG) with low energy spread. The microscope provides, for example, a spot size of 0.08 nm with a probe current of 200 pA and an energy spread of only 0.3 eV. The microscope is also equipped with an EDX system. For the acquisition of 3D information it has a tilt holder, and software for STEM and TEM tomography (Gatan). Unique is the capability to study samples in liquid using a special sample holder (Poseidon system of Protochips).
SCANNING ELECTRON MICROSCOPE JEOL JSM7500F
High vacuum scanning electron microscope with a cold field emitter for high resolutions, particularly in the case of low acceleration voltages from 0.1 kV. Semi-in-lens system with a JEOL r-filter for variable filtering of the backscattered and secondary electrons emitted by the sample. Additional LABe detector for backscattered electrons at extremely low acceleration voltages. Nitrogen-free “UltraDry Silicon Drift” EDX analysis system from Thermo Scientific (Noran 7) with a 30 mm2 detector area and an energy resolution of 130 eV.
SCANNING ELECTRON MICROSCOPE FEI QUANTA 400 FEG ESEM
The instrument is a scanning electron microscope with a Schottky emitter for examinations in a high vacuum (<10-5 Pa), low vacuum (up to 200 Pa) and ESEM (up to 2000 Pa) mode. Secondary-electron detector, backscattered-electron detector and STEM detector for all vacuum modes. Heating and cooling stages for in-situ examinations between 0°C and 1500°C. Nitrogen-cooled EDX analysis system by EDAX (Genesis 6.02) with an energy resolution of 127 eV.
TRANSMISSION ELECTRON MICROSCOPE FEI CM 200 FEG
The CM 200 FEG is a high-resolution transmission electron microscope for answering questions in respect of chemical composition, morphology and crystalline structure of materials. The instrument (manufacturer: Philips, year of manufacture 1994), equipped with a Schottky field emitter and operated using an acceleration voltage of at most 200 kV, achieves a point resolution of 2.4 Å using a Super-Twin objective lens. The instrument has the following operating modes: HR-TEM (imaging in diffraction and structure contrast), TEM Low Dose (imaging under low electron beam exposure), Nano Probe (analytic characterization of areas down to a minimum diameter of 1 nm). Imaging by means of scanning transmission electron microscopy (STEM) is not possible. The images are acquired by means of a “Gatan MultiScan Camera” (model 794) and evaluated by the image processing and analysis software “DigitalMicrograph”. There is an energy-dispersive X-ray spectrometer DX-4/Phönix by EDAX for qualitative and quantitative element analysis.
FLUORESCENCE MICROSCOPE LEICA DMI6000B
Fully motorized inverted fluorescence and interference contrast microscope including high-resolution water immersion- and oil lenses, high speed operation, continuous autofocus, cell incubator for live cell imaging, micromanipulator and injector, software for time-resolved imaging, and 3D imaging including deconvolution.