Conference on In-Situ and Correlative Electron Microscopy (CISCEM)

Conference on In-Situ and Correlative Electron Microscopy (CISCEM)

6-7 Nov. 2012, Saarbrücken, Germany

This conference aims to bring together an interdisciplinary group of scientists from the fields of biology, materials science, chemistry, and physics, to discuss future directions of electron microscopy research. Topics will include nanoscale study of biological samples, and functional materials under realistic or near realistic conditions, for example, in gaseous environments, at elevated temperatures, and in liquid. It will be discussed how processes can be studied by including the time domain in electron microscopy, or by a combination of different microscopy methods, for example, correlative fluorescence microscopy and electron microscopy, or by using nanoparticle labels. CISCEM will be the opening ceremony for the facility for in-situ electron microscopy based around the newly installed JEOL ARM200 STEM/TEM at the INM.

See also:
http://innovative-electron-microscopy.inm-gmbh.de.

The conference is part of a series of events celebrating the 25th Anniversary of the INM Leibniz-Institute for New Materials.

Confirmed Invited Speakers are:

  • Prof. Dr. Florian Banhart, University Strasbourg, France
  • Dr. John Briggs, European Molecular Biology Laboratory, Germany
  • Dr. Nigel Browning, Pacific Northwest National Laboratory, USA
  • Prof. Dr. Bram Koster, Leiden University, Netherlands
  • Prof. Dr. Peter Peters, The Netherlands Cancer Institute, Netherlands
  • Dr. Frances Ross, IBM, USA
  • Prof. Dr. Chikara Sato, National Institute of Advanced Industrial Science and Technology, and Tsukuba University, Japan
  • Dr. Raymond Unocic, Oak Ridge National Laboratory, USA
  • Prof. Dr. Henny Zandbergen, Delft University, Netherlands
  • Dr. Haimei Zhen, Lawrence Berkeley National Laboratory, USA