Conference on In-Situ and Correlative Electron Microscopy (CISCEM)
6-7 Nov. 2012, Saarbrücken, Germany
This conference was organized by the INM-Leibniz Institute for New Materials. The aim of the conference was to bring together an interdisciplinary group of scientists from the fields of biology, materials science, chemistry, and physics, to discuss future directions of electron microscopy research. Topics included nanoscale study of biological samples, and functional materials under realistic or near realistic conditions, for example, in gaseous environments, at elevated temperatures, and in liquid. It was discussed how processes can be studied by including the time domain in electron microscopy, or by a combination of different microscopy methods, for example, correlative fluorescence microscopy and electron microscopy, or by using nanoparticle labels. CISCEM was also the scientific opening ceremony of the facility for in-situ electron microscopy based around the newly installed JEOL ARM200 STEM/TEM at the INM. The venue location was the “Aula” of the Saarland University.
The extended abstracts will be published in the journal: Advances in Imaging and Electron Physics.
The conference is part of a series of events celebrating the 25th Anniversary of the INM Leibniz-Institute for New Materials.
Program: Program CISCEM
Confirmed Invited Speakers are:
- Prof. Dr. Florian Banhart, University Strasbourg, France
- Dr. John Briggs, European Molecular Biology Laboratory, Germany
- Dr. Nigel Browning, Pacific Northwest National Laboratory, USA
- Prof. Dr. Bram Koster, Leiden University, Netherlands
- Prof. Dr. Peter Peters, The Netherlands Cancer Institute, Netherlands
- Dr. Frances Ross, IBM, USA
- Prof. Dr. Chikara Sato, National Institute of Advanced Industrial Science and Technology, and Tsukuba University, Japan
- Dr. Raymond Unocic, Oak Ridge National Laboratory, USA
- Prof. Dr. Henny Zandbergen, Delft University, Netherlands
- Dr. Haimei Zhen, Lawrence Berkeley National Laboratory, USA